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Optics Express
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May 14, 2015
Imaging properties of extended depth of field microscopy through single-shot focus scanning
Sheng-Huei Lu, Hong Hua
Optics Letters
|
September 9, 2016
Structured illumination assisted microdeflectometry with optical depth scanning capability
Sheng-Huei Lu, Hong Hua
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Search research articles
Search
Showing results (1-10 of 2) with videos related to
Sort By:
Page
of 1
Optics Express
|
May 14, 2015
Imaging properties of extended depth of field microscopy through single-shot focus scanning
Sheng-Huei Lu, Hong Hua
Optics Letters
|
September 9, 2016
Structured illumination assisted microdeflectometry with optical depth scanning capability
Sheng-Huei Lu, Hong Hua
Page
of 1