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Shin Muramoto

Showing results (1-10 of 32) with videos related to

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The Analyst|September 17, 2014
Visualizing mass transport in desorption electrospray ionization using time-of-flight secondary ion mass spectrometry: a look at the geometric configuration of the sprayShin Muramoto
Analytical Chemistry|July 18, 2015
Strategies for potential age dating of fingerprints through the diffusion of sebum molecules on a nonporous surface analyzed using time-of-flight secondary ion mass spectrometryShin Muramoto, Edward Sisco
Surface and Interface Analysis : SIA|April 28, 2022
Deep depth profiling using gas cluster secondary ion mass spectrometry: Micrometer topography development and effects on depth resolutionShin Muramoto, Dan Graham
Surface and Interface Analysis : SIA|June 7, 2017
Low Temperature Plasma for the Preparation of Crater Walls for Compositional Depth Profiling of Thin Inorganic MultilayersShin Muramoto, Joe Bennett
Journal of Forensic Sciences|March 24, 2021
Visualizing shed skin cells in fingerprint residue using dark-field microscopyShin Muramoto, William Osborn, Greg Gillen
Surface and Interface Analysis : SIA|October 22, 2011
ToF-SIMS Depth Profiling of Trehalose: The Effect of Analysis Beam Dose on the Quality of Depth ProfilesShin Muramoto, Jeremy Brison, David Castner
Analytical Chemistry|November 17, 2011
Exploring the surface sensitivity of TOF-secondary ion mass spectrometry by measuring the implantation and sampling depths of Bi(n) and C60 ions in organic filmsShin Muramoto, Jeremy Brison, David G Castner
Nano Letters|November 25, 2015
Vapor-Liquid-Solid Etch of Semiconductor Surface Channels by Running Gold NanodropletsBabak Nikoobakht, Andrew Herzing, Shin Muramoto, et al.
Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films : an Official Journal of the American Vacuum Society|February 8, 2024
ToF-SIMS analysis of ultrathin films and their fragmentation patternsShin Muramoto, Daniel J Graham, David G Castner
Analytical Chemistry|November 10, 2012
Ambient low temperature plasma etching of polymer films for secondary ion mass spectrometry molecular depth profilingShin Muramoto, Matthew E Staymates, Tim M Brewer, et al.
Pageof 4

Showing results (1-10 of 32) with videos related to

Sort By:
Pageof 4
The Analyst|September 17, 2014
Visualizing mass transport in desorption electrospray ionization using time-of-flight secondary ion mass spectrometry: a look at the geometric configuration of the sprayShin Muramoto
Analytical Chemistry|July 18, 2015
Strategies for potential age dating of fingerprints through the diffusion of sebum molecules on a nonporous surface analyzed using time-of-flight secondary ion mass spectrometryShin Muramoto, Edward Sisco
Surface and Interface Analysis : SIA|April 28, 2022
Deep depth profiling using gas cluster secondary ion mass spectrometry: Micrometer topography development and effects on depth resolutionShin Muramoto, Dan Graham
Surface and Interface Analysis : SIA|June 7, 2017
Low Temperature Plasma for the Preparation of Crater Walls for Compositional Depth Profiling of Thin Inorganic MultilayersShin Muramoto, Joe Bennett
Journal of Forensic Sciences|March 24, 2021
Visualizing shed skin cells in fingerprint residue using dark-field microscopyShin Muramoto, William Osborn, Greg Gillen
Surface and Interface Analysis : SIA|October 22, 2011
ToF-SIMS Depth Profiling of Trehalose: The Effect of Analysis Beam Dose on the Quality of Depth ProfilesShin Muramoto, Jeremy Brison, David Castner
Analytical Chemistry|November 17, 2011
Exploring the surface sensitivity of TOF-secondary ion mass spectrometry by measuring the implantation and sampling depths of Bi(n) and C60 ions in organic filmsShin Muramoto, Jeremy Brison, David G Castner
Nano Letters|November 25, 2015
Vapor-Liquid-Solid Etch of Semiconductor Surface Channels by Running Gold NanodropletsBabak Nikoobakht, Andrew Herzing, Shin Muramoto, et al.
Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films : an Official Journal of the American Vacuum Society|February 8, 2024
ToF-SIMS analysis of ultrathin films and their fragmentation patternsShin Muramoto, Daniel J Graham, David G Castner
Analytical Chemistry|November 10, 2012
Ambient low temperature plasma etching of polymer films for secondary ion mass spectrometry molecular depth profilingShin Muramoto, Matthew E Staymates, Tim M Brewer, et al.
Pageof 4