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Micron (Oxford, England : 1993)|July 11, 2025
An empirical-parameter-free approach toward quantitative in situ electron tomography data analysis: in situ observation of metal nanoparticle sinteringShiro Ihara, Shunsuke Sato, Mizumo Yoshinaga, et al.Microscopy (Oxford, England)|March 11, 2024
In-situ heating-and-electron tomography for materials research: from 3D (in-situ 2D) to 4D (in-situ 3D)Satoshi Hata, Shiro Ihara, Hikaru Saito, et al.Scientific Reports|August 5, 2022
Deep learning-based noise filtering toward millisecond order imaging by using scanning transmission electron microscopyShiro Ihara, Hikaru Saito, Mizumo Yoshinaga, et al.Nanoscale|June 2, 2023
In situ electron tomography for the thermally activated solid reaction of anaerobic nanoparticlesShiro Ihara, Mizumo Yoshinaga, Hiroya Miyazaki, et al.Scientific Reports|October 27, 2021
Five-second STEM dislocation tomography for 300 nm thick specimen assisted by deep-learning-based noise filteringYifang Zhao, Suguru Koike, Rikuto Nakama, et al.Pageof 1