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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 5, 2019
Calibration of Atom Probe Tomography Reconstructions Through Correlation with Electron MicrographsIsabelle Mouton, Shyam Katnagallu, Surendra Kumar Makineni, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 28, 2023
A Machine Learning Framework for Quantifying Chemical Segregation and Microstructural Features in Atom Probe Tomography DataAlaukik Saxena, Nikita Polin, Navyanth Kusampudi, et al.Advanced Materials (Deerfield Beach, Fla.)|November 26, 2022
A New Class of Cluster-Matrix Nanocomposite Made of Fully Miscible ComponentsGleb Iankevich, Abhishek Sarkar, Shyam Katnagallu, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 13, 2024
Stacking Fault Segregation Imaging With Analytical Field Ion MicroscopyFelipe F Morgado, Leigh T Stephenson, Shalini Bhatt, et al.Small (Weinheim an Der Bergstrasse, Germany)|September 5, 2020
Nanoglass-Nanocrystal Composite-a Novel Material Class for Enhanced Strength-Plasticity SynergyShyam Katnagallu, Ge Wu, Shiv Prakash Singh, et al.Pageof 1