Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Sohei Motoki

Showing results (1-10 of 7) with videos related to

Pageof 1
Sort By:
Iucrj|May 21, 2020
Fast and accurate defocus modulation for improved tunability of cryo-EM experimentsRadostin Danev, Hirofumi Iijima, Mizuki Matsuzaki, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 25, 2016
Practical Experience with Hole-Free Phase Plates for Cryo Electron MicroscopyMichael Marko, Chyongere Hsieh, Eric Leith, et al.
Microscopy (Oxford, England)|November 28, 2012
Transmission electron microtomography in soft materialsHiroshi Jinnai, Toshihiko Tsuchiya, Sohei Motoki, et al.
Journal of Electron Microscopy|July 2, 2010
Dependence of beam broadening on detection angle in scanning transmission electron microtomographySohei Motoki, Takeshi Kaneko, Yoshitaka Aoyama, et al.
Micron (Oxford, England : 1993)|June 9, 2026
Special issue: Quantitative and precise measurements in conventional (scanning) electron microscopy and electron tomographyMarek Malac, Ken Harada, Toshie Yaguchi, et al.
Micron (Oxford, England : 1993)|October 10, 2018
Hole free phase plate tomography for materials sciences samplesMisa Hayashida, Kai Cui, Amin Morteza Najarian, et al.
Micron (Oxford, England : 1993)|October 29, 2020
Nanoparticle size and 3D shape measurement by electron tomography: An Inter-Laboratory ComparisonMisa Hayashida, Francisco Paraguay-Delgado, Carlos Ornelas, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Iucrj|May 21, 2020
Fast and accurate defocus modulation for improved tunability of cryo-EM experimentsRadostin Danev, Hirofumi Iijima, Mizuki Matsuzaki, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 25, 2016
Practical Experience with Hole-Free Phase Plates for Cryo Electron MicroscopyMichael Marko, Chyongere Hsieh, Eric Leith, et al.
Microscopy (Oxford, England)|November 28, 2012
Transmission electron microtomography in soft materialsHiroshi Jinnai, Toshihiko Tsuchiya, Sohei Motoki, et al.
Journal of Electron Microscopy|July 2, 2010
Dependence of beam broadening on detection angle in scanning transmission electron microtomographySohei Motoki, Takeshi Kaneko, Yoshitaka Aoyama, et al.
Micron (Oxford, England : 1993)|June 9, 2026
Special issue: Quantitative and precise measurements in conventional (scanning) electron microscopy and electron tomographyMarek Malac, Ken Harada, Toshie Yaguchi, et al.
Micron (Oxford, England : 1993)|October 10, 2018
Hole free phase plate tomography for materials sciences samplesMisa Hayashida, Kai Cui, Amin Morteza Najarian, et al.
Micron (Oxford, England : 1993)|October 29, 2020
Nanoparticle size and 3D shape measurement by electron tomography: An Inter-Laboratory ComparisonMisa Hayashida, Francisco Paraguay-Delgado, Carlos Ornelas, et al.
Pageof 1