Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Sri Addepalli

Showing results (1-10 of 3) with videos related to

Pageof 1
Sort By:
Sensors (Basel, Switzerland)|February 26, 2025
Effective Thermal Diffusivity Measurement Using Through-Transmission Pulsed Thermography: Extending the Current Practice by Incorporating Multi-Parameter OptimisationZain Ali, Sri Addepalli, Yifan Zhao
Sensors (Basel, Switzerland)|August 28, 2021
Quantifying Uncertainty in Pulsed Thermographic Inspection by Analysing the Thermal Diffusivity Measurements of Metals and CompositesSri Addepalli, Yifan Zhao, John Ahmet Erkoyuncu, et al.
Sensors (Basel, Switzerland)|September 9, 2020
A Novel Inspection Technique for Electronic Components Using Thermography (NITECT)Haochen Liu, Lawrence Tinsley, Wayne Lam, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
Sensors (Basel, Switzerland)|February 26, 2025
Effective Thermal Diffusivity Measurement Using Through-Transmission Pulsed Thermography: Extending the Current Practice by Incorporating Multi-Parameter OptimisationZain Ali, Sri Addepalli, Yifan Zhao
Sensors (Basel, Switzerland)|August 28, 2021
Quantifying Uncertainty in Pulsed Thermographic Inspection by Analysing the Thermal Diffusivity Measurements of Metals and CompositesSri Addepalli, Yifan Zhao, John Ahmet Erkoyuncu, et al.
Sensors (Basel, Switzerland)|September 9, 2020
A Novel Inspection Technique for Electronic Components Using Thermography (NITECT)Haochen Liu, Lawrence Tinsley, Wayne Lam, et al.
Pageof 1