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Sriharsha Veeramachaneni

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IEEE Transactions on Pattern Analysis and Machine Intelligence|January 5, 2005
Style context with second-order statisticsSriharsha Veeramachaneni, George Nagy
IEEE Transactions on Pattern Analysis and Machine Intelligence|May 15, 2007
Analytical results on style-constrained bayesian classification of pattern fieldsSriharsha Veeramachaneni, George Nagy
Pageof 1

Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
IEEE Transactions on Pattern Analysis and Machine Intelligence|January 5, 2005
Style context with second-order statisticsSriharsha Veeramachaneni, George Nagy
IEEE Transactions on Pattern Analysis and Machine Intelligence|May 15, 2007
Analytical results on style-constrained bayesian classification of pattern fieldsSriharsha Veeramachaneni, George Nagy
Pageof 1