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Annals of Plastic Surgery|June 30, 2011
Complete excision of nonmelanotic skin cancer: a matter of surgical experienceStefan Riml, Lorenz Larcher, Peter Kompatscher
International Journal of Dermatology|December 11, 2013
Defect closure in the paranasal region: an enduring challengeStefan Riml, Lorenz Larcher, Martin Grohmann, et al.
Journal of Plastic, Reconstructive & Aesthetic Surgery : JPRAS|January 11, 2011
Management of complications following aesthetic procedures can lead to significant additional costLorenz Larcher, Ingo Plötzeneder, Stefan Riml, et al.
Photodermatology, Photoimmunology & Photomedicine|July 3, 2013
Second-degree burn within a tattoo after intense-pulsed-light epilationStefan Riml, Lorenz Larcher, Martin Grohmann, et al.
Journal of Plastic, Reconstructive & Aesthetic Surgery : JPRAS|December 15, 2010
Retroauricular pull-through island flap for defect closure of auricular scapha defects--a safe one-stage techniqueLorenz Larcher, Ingo Plötzeneder, Christoph Tasch, et al.
Aesthetic Plastic Surgery|December 25, 2010
Aesthetic improvements of skin grafts in nasal tip reconstructionStefan Riml, Heinz Wallner, Lorenz Larcher, et al.
Wiener Klinische Wochenschrift|August 24, 2010
The toothpick-tale - Take your patient seriously: a decade of pain and immobilization caused by an unrecognized toothpick!Lorenz Larcher, Ingo Plötzeneder, Stefan Riml, et al.
Wiener Klinische Wochenschrift|August 2, 2012
Neoadjuvant radiotherapy of head and neck carcinoma: an obstacle for plastic reconstruction?Stefan Riml, Franz Böhler, Lorenz Larcher, et al.
The Journal of Steroid Biochemistry and Molecular Biology|April 30, 2005
Glucocorticoid-induced apoptosis and glucocorticoid resistance in acute lymphoblastic leukemiaChristian Ploner, Stefan Schmidt, Elisabeth Presul, et al.
Journal of Cranio-Maxillo-Facial Surgery : Official Publication of the European Association for Cranio-Maxillo-Facial Surgery|December 13, 2012
Surgical correction of rhinophyma: comparison of two methods in a 15-year-long experienceDavide Lazzeri, Lorenz Larcher, Georg M Huemer, et al.
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