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Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

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JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

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Stefan Witte

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Optics Express|November 23, 2021

Aberration calibration and correction with nano-scatterers in digital holographic microscopy for semiconductor metrologyChristos Messinis, Theodorus T M van Schaijk, Nitesh Pandey, et al.

Optics Express|May 9, 2023

PtyLab.m/py/jl: a cross-platform, open-source inverse modeling toolbox for conventional and Fourier ptychographyLars Loetgering, Mengqi Du, Dirk Boonzajer Flaes, et al.

Physical Review Letters|September 26, 2012

Direct visualization of laser-driven electron multiple scattering and tunneling distance in strong-field ionizationDaniel D Hickstein, Predrag Ranitovic, Stefan Witte, et al.

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Search research articles

Showing results (41-50 of 43) with videos related to

Sort By:

Pageof 5

You have reached the last page of results.This site can display upto 43 results.

Optics Express|November 23, 2021

Aberration calibration and correction with nano-scatterers in digital holographic microscopy for semiconductor metrologyChristos Messinis, Theodorus T M van Schaijk, Nitesh Pandey, et al.

Optics Express|May 9, 2023

PtyLab.m/py/jl: a cross-platform, open-source inverse modeling toolbox for conventional and Fourier ptychographyLars Loetgering, Mengqi Du, Dirk Boonzajer Flaes, et al.

Physical Review Letters|September 26, 2012

Direct visualization of laser-driven electron multiple scattering and tunneling distance in strong-field ionizationDaniel D Hickstein, Predrag Ranitovic, Stefan Witte, et al.

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