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Stephen E Musson

Showing results (1-10 of 6) with videos related to

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Journal of Hazardous Materials|July 5, 2008
Pharmaceutical compound content of municipal solid wasteStephen E Musson, Timothy G Townsend
Waste Management (New York, N.Y.)|November 6, 2007
Measuring the gypsum content of C&D debris finesStephen E Musson, Qiyong Xu, Timothy G Townsend
Waste Management (New York, N.Y.)|September 20, 2005
Factors affecting TCLP lead leachability from computer CPUsKevin N Vann, Stephen E Musson, Timothy G Townsend
Journal of the Air & Waste Management Association (1995)|August 11, 2007
A continuous collection system for household pharmaceutical wastes: a pilot projectStephen E Musson, Timothy Townsend, Kurt Seaburg, et al.
The Science of the Total Environment|February 19, 2010
Assessment of the anaerobic degradation of six active pharmaceutical ingredientsStephen E Musson, Pablo Campo, Thabet Tolaymat, et al.
Environmental Science & Technology|May 11, 2006
RCRA toxicity characterization of discarded electronic devicesStephen E Musson, Kevin N Vann, Yong-Chul Jang, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Journal of Hazardous Materials|July 5, 2008
Pharmaceutical compound content of municipal solid wasteStephen E Musson, Timothy G Townsend
Waste Management (New York, N.Y.)|November 6, 2007
Measuring the gypsum content of C&D debris finesStephen E Musson, Qiyong Xu, Timothy G Townsend
Waste Management (New York, N.Y.)|September 20, 2005
Factors affecting TCLP lead leachability from computer CPUsKevin N Vann, Stephen E Musson, Timothy G Townsend
Journal of the Air & Waste Management Association (1995)|August 11, 2007
A continuous collection system for household pharmaceutical wastes: a pilot projectStephen E Musson, Timothy Townsend, Kurt Seaburg, et al.
The Science of the Total Environment|February 19, 2010
Assessment of the anaerobic degradation of six active pharmaceutical ingredientsStephen E Musson, Pablo Campo, Thabet Tolaymat, et al.
Environmental Science & Technology|May 11, 2006
RCRA toxicity characterization of discarded electronic devicesStephen E Musson, Kevin N Vann, Yong-Chul Jang, et al.
Pageof 1