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Steven X Ding

Showing results (21-30 of 25) with videos related to

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IEEE Transactions on Neural Networks and Learning Systems|August 14, 2024
Variational Discriminative Stacked Auto-Encoder: Feature Representation Using a Prelearned Discriminator, and Its Application to Industrial Process MonitoringJian Huang, Xiaoyang Sun, Steven X Ding, et al.
IEEE Transactions on Neural Networks and Learning Systems|April 22, 2021
A Comparative Study of Deep Neural Network-Aided Canonical Correlation Analysis-Based Process Monitoring and Fault Detection MethodsZhiwen Chen, Ketian Liang, Steven X Ding, et al.
IEEE Transactions on Neural Networks and Learning Systems|September 5, 2024
Explainable Fault Diagnosis Using Invertible Neural Networks-Part I: A Left Manifold-Based SolutionHongtian Chen, Wenxin Sun, Weidong Zhang, et al.
ISA Transactions|February 14, 2017
A KPI-based process monitoring and fault detection framework for large-scale processesKai Zhang, Yuri A W Shardt, Zhiwen Chen, et al.
IEEE Transactions on Neural Networks and Learning Systems|October 16, 2023
Bayesian Hierarchical Graph Neural Networks With Uncertainty Feedback for Trustworthy Fault Diagnosis of Industrial ProcessesDongyue Chen, Zongxia Xie, Ruonan Liu, et al.
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Showing results (21-30 of 25) with videos related to

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Pageof 3
You have reached the last page of results.This site can display upto 25 results.
IEEE Transactions on Neural Networks and Learning Systems|August 14, 2024
Variational Discriminative Stacked Auto-Encoder: Feature Representation Using a Prelearned Discriminator, and Its Application to Industrial Process MonitoringJian Huang, Xiaoyang Sun, Steven X Ding, et al.
IEEE Transactions on Neural Networks and Learning Systems|April 22, 2021
A Comparative Study of Deep Neural Network-Aided Canonical Correlation Analysis-Based Process Monitoring and Fault Detection MethodsZhiwen Chen, Ketian Liang, Steven X Ding, et al.
IEEE Transactions on Neural Networks and Learning Systems|September 5, 2024
Explainable Fault Diagnosis Using Invertible Neural Networks-Part I: A Left Manifold-Based SolutionHongtian Chen, Wenxin Sun, Weidong Zhang, et al.
ISA Transactions|February 14, 2017
A KPI-based process monitoring and fault detection framework for large-scale processesKai Zhang, Yuri A W Shardt, Zhiwen Chen, et al.
IEEE Transactions on Neural Networks and Learning Systems|October 16, 2023
Bayesian Hierarchical Graph Neural Networks With Uncertainty Feedback for Trustworthy Fault Diagnosis of Industrial ProcessesDongyue Chen, Zongxia Xie, Ruonan Liu, et al.
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