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Stuart I Wright
Matthew M Nowell
David P Field

Showing results (11-20 of 15) with videos related to

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Data in Brief|December 22, 2017
Reconstructed and analyzed X-ray computed tomography data of investment-cast and additive-manufactured aluminum foam for visualizing ligament failure mechanisms and regions of contact during a compression testKristoffer E Matheson, Kory K Cross, Matthew M Nowell, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 17, 2015
Characterization of Sputtered CdTe Thin Films with Electron Backscatter Diffraction and Correlation with Device PerformanceMatthew M Nowell, Michael A Scarpulla, Naba R Paudel, et al.
Materials & Design|April 4, 2022
Additive manufacturing of Ti-Ni bimetallic structuresAli Afrouzian, Cory J Groden, David P Field, et al.
Ultramicroscopy|November 18, 2017
Improved twin detection via tracking of individual Kikuchi band intensity of EBSD patternsTravis M Rampton, Stuart I Wright, Michael P Miles, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 7, 2017
Influence of Noise-Generating Factors on Cross-Correlation Electron Backscatter Diffraction (EBSD) Measurement of Geometrically Necessary Dislocations (GNDs)Landon T Hansen, Brian E Jackson, David T Fullwood, et al.
Pageof 2

Showing results (11-20 of 15) with videos related to

Sort By:
Pageof 2
You have reached the last page of results.This site can display upto 15 results.
Data in Brief|December 22, 2017
Reconstructed and analyzed X-ray computed tomography data of investment-cast and additive-manufactured aluminum foam for visualizing ligament failure mechanisms and regions of contact during a compression testKristoffer E Matheson, Kory K Cross, Matthew M Nowell, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 17, 2015
Characterization of Sputtered CdTe Thin Films with Electron Backscatter Diffraction and Correlation with Device PerformanceMatthew M Nowell, Michael A Scarpulla, Naba R Paudel, et al.
Materials & Design|April 4, 2022
Additive manufacturing of Ti-Ni bimetallic structuresAli Afrouzian, Cory J Groden, David P Field, et al.
Ultramicroscopy|November 18, 2017
Improved twin detection via tracking of individual Kikuchi band intensity of EBSD patternsTravis M Rampton, Stuart I Wright, Michael P Miles, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 7, 2017
Influence of Noise-Generating Factors on Cross-Correlation Electron Backscatter Diffraction (EBSD) Measurement of Geometrically Necessary Dislocations (GNDs)Landon T Hansen, Brian E Jackson, David T Fullwood, et al.
Pageof 2