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Stuart J Ingleby

Showing results (1-10 of 6) with videos related to

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The Review of Scientific Instruments|February 17, 2026
Intrinsic atomic calibration of oscillating magnetic fields in ULF and VLF bandsZak Johnston, Paul F Griffin, Erling Riis, et al.
The Review of Scientific Instruments|May 3, 2020
A feed-forward measurement scheme for periodic noise suppression in atomic magnetometryCarolyn O'Dwyer, Stuart J Ingleby, Iain C Chalmers, et al.
Scientific Reports|March 26, 2017
Grating chips for quantum technologiesJames P McGilligan, Paul F Griffin, Rachel Elvin, et al.
Optics Express|October 20, 2023
Free-induction-decay magnetic field imaging with a microfabricated Cs vapor cellDominic Hunter, Chris Perrella, Allan McWilliam, et al.
Scientific Reports|November 15, 2024
Distributed network of optically pumped magnetometers for space weather monitoringMarcin S Mrozowski, Angus S Bell, Paul F Griffin, et al.
IEEE Transactions on Instrumentation and Measurement|April 20, 2026
High-Resolution Atomic Magnetometer-Based Imaging of Integrated Circuits and BatteriesDominic Hunter, Marcin S Mrozowski, Stuart J Ingleby, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
The Review of Scientific Instruments|February 17, 2026
Intrinsic atomic calibration of oscillating magnetic fields in ULF and VLF bandsZak Johnston, Paul F Griffin, Erling Riis, et al.
The Review of Scientific Instruments|May 3, 2020
A feed-forward measurement scheme for periodic noise suppression in atomic magnetometryCarolyn O'Dwyer, Stuart J Ingleby, Iain C Chalmers, et al.
Scientific Reports|March 26, 2017
Grating chips for quantum technologiesJames P McGilligan, Paul F Griffin, Rachel Elvin, et al.
Optics Express|October 20, 2023
Free-induction-decay magnetic field imaging with a microfabricated Cs vapor cellDominic Hunter, Chris Perrella, Allan McWilliam, et al.
Scientific Reports|November 15, 2024
Distributed network of optically pumped magnetometers for space weather monitoringMarcin S Mrozowski, Angus S Bell, Paul F Griffin, et al.
IEEE Transactions on Instrumentation and Measurement|April 20, 2026
High-Resolution Atomic Magnetometer-Based Imaging of Integrated Circuits and BatteriesDominic Hunter, Marcin S Mrozowski, Stuart J Ingleby, et al.
Pageof 1