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Journal of Electron Microscopy|June 8, 2004
Optical characterization of individual semiconductor nanostructures using a scanning tunneling microscopeTohru Tsuruoka, Sukekatsu Ushioda
Physical Review Letters|July 13, 2004
Energy loss of photoelectrons by interaction with image chargeRyuichi Arafune, Kei Hayashi, Shigenori Ueda, et al.
Physical Review Letters|December 31, 2005
Inelastic photoemission due to scattering by surface adsorbate vibrationsRyuichi Arafune, Kei Hayashi, Shigenori Ueda, et al.
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