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Sukmock Lee

Showing results (1-10 of 10) with videos related to

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Applied Optics|February 3, 2016
Calibration method for high-accuracy measurement of long focal length with Talbot interferometry: commentSukmock Lee
Optics Express|April 1, 2009
Direct determination of f-number by using Ronchi testSukmock Lee
Optics Express|February 4, 2009
Ronchigram quantification via a non-complementary dark-space effectSukmock Lee, Jose Sasian
Optics Express|October 14, 2010
Validation of quantitative Ronchi test through numerical propagationSukmock Lee, Manuel Guizar-Sicairos
Optics Express|August 20, 2010
Determination of paraxial image plane location by using Ronchi testJinhun Jeong, Byongchan Lee, Sukmock Lee
Optics Express|September 24, 2016
Precise and fast spatial-frequency analysis using the iterative local Fourier transformSukmock Lee, Heejoo Choi, Dae Wook Kim
Applied Optics|February 15, 2012
Self-consistent way to determine relative distortion of axial symmetric lens systemsSukmock Lee, Robert Parks, James H Burge
Applied Optics|October 17, 2014
Accurate determination of distortion for smartphone camerasSukmock Lee, Byongoh Kim, Jiyeon Lee, et al.
Nano Letters|June 28, 2016
Asymmetric Hysteresis for Probing Dzyaloshinskii-Moriya InteractionDong-Soo Han, Nam-Hui Kim, June-Seo Kim, et al.
Nature Communications|July 9, 2015
Thickness dependence of the interfacial Dzyaloshinskii-Moriya interaction in inversion symmetry broken systemsJaehun Cho, Nam-Hui Kim, Sukmock Lee, et al.
Pageof 1

Showing results (1-10 of 10) with videos related to

Sort By:
Pageof 1
Applied Optics|February 3, 2016
Calibration method for high-accuracy measurement of long focal length with Talbot interferometry: commentSukmock Lee
Optics Express|April 1, 2009
Direct determination of f-number by using Ronchi testSukmock Lee
Optics Express|February 4, 2009
Ronchigram quantification via a non-complementary dark-space effectSukmock Lee, Jose Sasian
Optics Express|October 14, 2010
Validation of quantitative Ronchi test through numerical propagationSukmock Lee, Manuel Guizar-Sicairos
Optics Express|August 20, 2010
Determination of paraxial image plane location by using Ronchi testJinhun Jeong, Byongchan Lee, Sukmock Lee
Optics Express|September 24, 2016
Precise and fast spatial-frequency analysis using the iterative local Fourier transformSukmock Lee, Heejoo Choi, Dae Wook Kim
Applied Optics|February 15, 2012
Self-consistent way to determine relative distortion of axial symmetric lens systemsSukmock Lee, Robert Parks, James H Burge
Applied Optics|October 17, 2014
Accurate determination of distortion for smartphone camerasSukmock Lee, Byongoh Kim, Jiyeon Lee, et al.
Nano Letters|June 28, 2016
Asymmetric Hysteresis for Probing Dzyaloshinskii-Moriya InteractionDong-Soo Han, Nam-Hui Kim, June-Seo Kim, et al.
Nature Communications|July 9, 2015
Thickness dependence of the interfacial Dzyaloshinskii-Moriya interaction in inversion symmetry broken systemsJaehun Cho, Nam-Hui Kim, Sukmock Lee, et al.
Pageof 1