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Physical Review Letters
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August 4, 2023
Voltage X-Ray Reflectometry: A Method to Study Electric-Field-Induced Changes in Interfacial Electronic Structures
Sven Erik Ilse, Gisela Schütz, Eberhard Goering
The Journal of Chemical Physics
|
October 27, 2016
Surface roughness stabilizes the clustering of self-propelled triangles
Sven Erik Ilse, Christian Holm, Joost de Graaf
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Search research articles
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Showing results (1-10 of 2) with videos related to
Sort By:
Page
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Physical Review Letters
|
August 4, 2023
Voltage X-Ray Reflectometry: A Method to Study Electric-Field-Induced Changes in Interfacial Electronic Structures
Sven Erik Ilse, Gisela Schütz, Eberhard Goering
The Journal of Chemical Physics
|
October 27, 2016
Surface roughness stabilizes the clustering of self-propelled triangles
Sven Erik Ilse, Christian Holm, Joost de Graaf
Page
of 1