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Analytical Chemistry|February 15, 2017
Large O2 Cluster Ions as Sputter Beam for ToF-SIMS Depth Profiling of Alkali Metals in Thin SiO2 FilmsSabine Holzer, Stefan Krivec, Sven Kayser, et al.
Scientific Reports|July 1, 2021
High resolution nanoscale chemical analysis of bitumen surface microstructuresAyse N Koyun, Julia Zakel, Sven Kayser, et al.
Angewandte Chemie (International Ed. in English)|February 19, 2016
Simultaneous Dual Encoding of Three-Dimensional Structures by Light-Induced Modular LigationTanja K Claus, Benjamin Richter, Vincent Hahn, et al.
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