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T Akazaki

Showing results (1-10 of 6) with videos related to

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Physical Review Letters|April 7, 2010
Fano-Kondo interplay in a side-coupled double quantum dotS Sasaki, H Tamura, T Akazaki, et al.
Physical Review Letters|April 7, 2010
Kondo effect in a semiconductor quantum dot with a spin-accumulated leadT Kobayashi, S Tsuruta, S Sasaki, et al.
Physical Review Letters|December 31, 2008
Evidence of a transition from nonlinear to linear screening of a two-dimensional electron system detected by photoluminescence spectroscopyM Yamaguchi, S Nomura, T Maruyama, et al.
Physical Review Letters|October 26, 2005
Collapse of thermal activation in moderately damped Josephson junctionsV M Krasnov, T Bauch, S Intiso, et al.
Physical Review Letters|January 17, 2012
Near-field optical mapping of quantum Hall edge statesH Ito, K Furuya, Y Shibata, et al.
Physical Review Letters|November 24, 2011
Enhanced photon generation in a Nb/n-InGaAs/p-InP superconductor/semiconductor-diode light emitting deviceH Sasakura, S Kuramitsu, Y Hayashi, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Physical Review Letters|April 7, 2010
Fano-Kondo interplay in a side-coupled double quantum dotS Sasaki, H Tamura, T Akazaki, et al.
Physical Review Letters|April 7, 2010
Kondo effect in a semiconductor quantum dot with a spin-accumulated leadT Kobayashi, S Tsuruta, S Sasaki, et al.
Physical Review Letters|December 31, 2008
Evidence of a transition from nonlinear to linear screening of a two-dimensional electron system detected by photoluminescence spectroscopyM Yamaguchi, S Nomura, T Maruyama, et al.
Physical Review Letters|October 26, 2005
Collapse of thermal activation in moderately damped Josephson junctionsV M Krasnov, T Bauch, S Intiso, et al.
Physical Review Letters|January 17, 2012
Near-field optical mapping of quantum Hall edge statesH Ito, K Furuya, Y Shibata, et al.
Physical Review Letters|November 24, 2011
Enhanced photon generation in a Nb/n-InGaAs/p-InP superconductor/semiconductor-diode light emitting deviceH Sasakura, S Kuramitsu, Y Hayashi, et al.
Pageof 1