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T C Petersen

Showing results (1-10 of 377) with videos related to

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Microscopy Research and Technique|July 16, 2011
RDFTools: a software tool for quantifying short-range ordering in amorphous materialsD R G Mitchell, T C Petersen
Ultramicroscopy|June 14, 2011
Macroscopic electrical field distribution and field-induced surface stresses of needle-shaped field emittersCharles Moy, Gianluca Ranzi, T C Petersen, et al.
The Journal of Chemical Physics|June 15, 2007
Modeling of structure and porosity in amorphous silicon systems using Monte Carlo methodsG Opletal, T C Petersen, I K Snook, et al.
Physical Review Letters|November 9, 2019
Braiding and Fusion of Non-Abelian Vortex AnyonsT Mawson, T C Petersen, J K Slingerland, et al.
Physical Chemistry Chemical Physics : PCCP|March 8, 2019
Vacancy induced formation of nanoporous silicon, carbon and silicon carbideG Opletal, B Sun, T C Petersen, et al.
Optics Express|November 10, 2016
Effect of specimen orientation on the accuracy of vector field electron tomographyZ D C Kemp, D M Paganin, T C Petersen, et al.
Ultramicroscopy|May 12, 2005
Refinements in the collection of energy filtered diffraction patterns from disordered materialsT C Petersen, W McBride, D G McCulloch, et al.
Micron (Oxford, England : 1993)|July 8, 2019
High contrast at low dose using a single, defocussed transmission electron micrographL Clark, T C Petersen, T Williams, et al.
Physical Review Letters|April 2, 2019
Simple Wave-Optical Superpositions as Prime Number SievesT C Petersen, M Ceko, I D Svalbe, et al.
Physical Review Letters|February 5, 2013
Electron vortex production and control using aberration induced diffraction catastrophesT C Petersen, M Weyland, D M Paganin, et al.
Pageof 38

Showing results (1-10 of 377) with videos related to

Sort By:
Pageof 38
Microscopy Research and Technique|July 16, 2011
RDFTools: a software tool for quantifying short-range ordering in amorphous materialsD R G Mitchell, T C Petersen
Ultramicroscopy|June 14, 2011
Macroscopic electrical field distribution and field-induced surface stresses of needle-shaped field emittersCharles Moy, Gianluca Ranzi, T C Petersen, et al.
The Journal of Chemical Physics|June 15, 2007
Modeling of structure and porosity in amorphous silicon systems using Monte Carlo methodsG Opletal, T C Petersen, I K Snook, et al.
Physical Review Letters|November 9, 2019
Braiding and Fusion of Non-Abelian Vortex AnyonsT Mawson, T C Petersen, J K Slingerland, et al.
Physical Chemistry Chemical Physics : PCCP|March 8, 2019
Vacancy induced formation of nanoporous silicon, carbon and silicon carbideG Opletal, B Sun, T C Petersen, et al.
Optics Express|November 10, 2016
Effect of specimen orientation on the accuracy of vector field electron tomographyZ D C Kemp, D M Paganin, T C Petersen, et al.
Ultramicroscopy|May 12, 2005
Refinements in the collection of energy filtered diffraction patterns from disordered materialsT C Petersen, W McBride, D G McCulloch, et al.
Micron (Oxford, England : 1993)|July 8, 2019
High contrast at low dose using a single, defocussed transmission electron micrographL Clark, T C Petersen, T Williams, et al.
Physical Review Letters|April 2, 2019
Simple Wave-Optical Superpositions as Prime Number SievesT C Petersen, M Ceko, I D Svalbe, et al.
Physical Review Letters|February 5, 2013
Electron vortex production and control using aberration induced diffraction catastrophesT C Petersen, M Weyland, D M Paganin, et al.
Pageof 38