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T Chidambaram

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IEEE Electron Device Letters : a Publication of the IEEE Electron Devices Society|October 31, 2024
InGaAs Inversion Layer Mobility and Interface Trap Density from Gated Hall MeasurementsT Chidambaram, D Veksler, S Madisetti, et al.
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IEEE Electron Device Letters : a Publication of the IEEE Electron Devices Society|October 31, 2024
InGaAs Inversion Layer Mobility and Interface Trap Density from Gated Hall MeasurementsT Chidambaram, D Veksler, S Madisetti, et al.
Pageof 1