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T E Flick

Showing results (1-10 of 5) with videos related to

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IEEE Transactions on Pattern Analysis and Machine Intelligence|April 14, 2012
Classification error for a very large number of classesK Fukunaga, T E Flick
IEEE Transactions on Pattern Analysis and Machine Intelligence|August 27, 2011
Estimation of the parameters of a gaussian mixture using the method of momentsK Fukunaga, T E Flick
IEEE Transactions on Pattern Analysis and Machine Intelligence|August 27, 2011
A Test of the Gaussian-ness of a Data Set Using ClusteringK Fukunaga, T E Flick
IEEE Transactions on Pattern Analysis and Machine Intelligence|August 27, 2011
The 2-NN Rule for More Accurate NN Risk EstimationK Fukunaga, T E Flick
IEEE Transactions on Pattern Analysis and Machine Intelligence|August 27, 2011
An optimal global nearest neighbor metricK Fukunaga, T E Flick
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
IEEE Transactions on Pattern Analysis and Machine Intelligence|April 14, 2012
Classification error for a very large number of classesK Fukunaga, T E Flick
IEEE Transactions on Pattern Analysis and Machine Intelligence|August 27, 2011
Estimation of the parameters of a gaussian mixture using the method of momentsK Fukunaga, T E Flick
IEEE Transactions on Pattern Analysis and Machine Intelligence|August 27, 2011
A Test of the Gaussian-ness of a Data Set Using ClusteringK Fukunaga, T E Flick
IEEE Transactions on Pattern Analysis and Machine Intelligence|August 27, 2011
The 2-NN Rule for More Accurate NN Risk EstimationK Fukunaga, T E Flick
IEEE Transactions on Pattern Analysis and Machine Intelligence|August 27, 2011
An optimal global nearest neighbor metricK Fukunaga, T E Flick
Pageof 1