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T Gotszalk

Showing results (1-10 of 8) with videos related to

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Micron (Oxford, England : 1993)|February 2, 2023
Ion microsource integrated with scanning electron microscope for sample preparationW Slówko, T Gotszalk
Ultramicroscopy|April 1, 2014
Investigation of multi-junction solar cells using electrostatic force microscopy methodsM Moczała, N Sosa, A Topol, et al.
Ultramicroscopy|June 26, 2012
Regularization mechanism in blind tip reconstruction procedureG Jóźwiak, A Henrykowski, A Masalska, et al.
Ultramicroscopy|June 13, 2003
Quantum size aspects of the piezoresistive effect in ultra thin piezoresistorsTzv Ivanov, T Gotszalk, T Sulzbach, et al.
Nanotechnology|June 30, 2020
Near-zero contact force atomic force microscopy investigations using active electromagnetic cantileversB Świadkowski, W Majstrzyk, P Kunicki, et al.
Micron (Oxford, England : 1993)|February 26, 2016
Metrology of electromagnetic static actuation of MEMS microbridge using atomic force microscopyM Moczała, W Majstrzyk, A Sierakowski, et al.
The Review of Scientific Instruments|November 4, 2011
Expanded beam deflection method for simultaneous measurement of displacement and vibrations of multiple microcantileversK Nieradka, G Małozięć, D Kopiec, et al.
Ultramicroscopy|September 27, 2017
Contact atomic force microscopy using piezoresistive cantilevers in load force modulation modeP Biczysko, A Dzierka, G Jóźwiak, et al.
Pageof 1

Showing results (1-10 of 8) with videos related to

Sort By:
Pageof 1
Micron (Oxford, England : 1993)|February 2, 2023
Ion microsource integrated with scanning electron microscope for sample preparationW Slówko, T Gotszalk
Ultramicroscopy|April 1, 2014
Investigation of multi-junction solar cells using electrostatic force microscopy methodsM Moczała, N Sosa, A Topol, et al.
Ultramicroscopy|June 26, 2012
Regularization mechanism in blind tip reconstruction procedureG Jóźwiak, A Henrykowski, A Masalska, et al.
Ultramicroscopy|June 13, 2003
Quantum size aspects of the piezoresistive effect in ultra thin piezoresistorsTzv Ivanov, T Gotszalk, T Sulzbach, et al.
Nanotechnology|June 30, 2020
Near-zero contact force atomic force microscopy investigations using active electromagnetic cantileversB Świadkowski, W Majstrzyk, P Kunicki, et al.
Micron (Oxford, England : 1993)|February 26, 2016
Metrology of electromagnetic static actuation of MEMS microbridge using atomic force microscopyM Moczała, W Majstrzyk, A Sierakowski, et al.
The Review of Scientific Instruments|November 4, 2011
Expanded beam deflection method for simultaneous measurement of displacement and vibrations of multiple microcantileversK Nieradka, G Małozięć, D Kopiec, et al.
Ultramicroscopy|September 27, 2017
Contact atomic force microscopy using piezoresistive cantilevers in load force modulation modeP Biczysko, A Dzierka, G Jóźwiak, et al.
Pageof 1