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T H Metzger

Showing results (1-10 of 21) with videos related to

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Applied Optics|March 1, 1997
Structure and normal incidence soft-x-ray reflectivity of Ni-Nb/C amorphous multilayersS Vitta, T H Metzger, J Peisl
Physical Review Letters|February 1, 2008
Defect cores investigated by x-ray scattering close to forbidden reflections in siliconM-I Richard, T H Metzger, V Holý, et al.
Journal of Synchrotron Radiation|April 26, 2003
A focusing crystal analyser for the rejection of inelastic X-ray scatteringM A Hamilton, T H Metzger, A Mazuelas, et al.
Chemical Communications (Cambridge, England)|March 5, 2003
Pure silica BETA colloidal zeolite assembled in thin filmsS Mintova, M Reinelt, T H Metzger, et al.
Chemphyschem : a European Journal of Chemical Physics and Physical Chemistry|October 27, 2009
X-ray diffraction as a local probe toolJ Stangl, C Mocuta, A Diaz, et al.
The Journal of Physical Chemistry. B|July 21, 2006
Ordered micro/mesoporous composite prepared as thin filmsN Petkov, M Hölzl, T H Metzger, et al.
Physical Review Letters|May 23, 2006
Local structure of a rolled-up single crystal: an X-ray microdiffraction study of individual semiconductor nanotubesB Krause, C Mocuta, T H Metzger, et al.
Journal of Physics. Condensed Matter : an Institute of Physics Journal|July 29, 2011
Nanoscale structures and dynamics of a boundary liquid layerM Walz, S Gerth, P Falus, et al.
Nanotechnology|August 6, 2011
Early stage of ripple formation on Ge(001) surfaces under near-normal ion beam sputteringD Carbone, A Alija, O Plantevin, et al.
Journal of Synchrotron Radiation|July 2, 2002
X-ray diffraction from rectangular slitsD Le Bolloc'h, F Livet, F Bley, et al.
Pageof 3

Showing results (1-10 of 21) with videos related to

Sort By:
Pageof 3
Applied Optics|March 1, 1997
Structure and normal incidence soft-x-ray reflectivity of Ni-Nb/C amorphous multilayersS Vitta, T H Metzger, J Peisl
Physical Review Letters|February 1, 2008
Defect cores investigated by x-ray scattering close to forbidden reflections in siliconM-I Richard, T H Metzger, V Holý, et al.
Journal of Synchrotron Radiation|April 26, 2003
A focusing crystal analyser for the rejection of inelastic X-ray scatteringM A Hamilton, T H Metzger, A Mazuelas, et al.
Chemical Communications (Cambridge, England)|March 5, 2003
Pure silica BETA colloidal zeolite assembled in thin filmsS Mintova, M Reinelt, T H Metzger, et al.
Chemphyschem : a European Journal of Chemical Physics and Physical Chemistry|October 27, 2009
X-ray diffraction as a local probe toolJ Stangl, C Mocuta, A Diaz, et al.
The Journal of Physical Chemistry. B|July 21, 2006
Ordered micro/mesoporous composite prepared as thin filmsN Petkov, M Hölzl, T H Metzger, et al.
Physical Review Letters|May 23, 2006
Local structure of a rolled-up single crystal: an X-ray microdiffraction study of individual semiconductor nanotubesB Krause, C Mocuta, T H Metzger, et al.
Journal of Physics. Condensed Matter : an Institute of Physics Journal|July 29, 2011
Nanoscale structures and dynamics of a boundary liquid layerM Walz, S Gerth, P Falus, et al.
Nanotechnology|August 6, 2011
Early stage of ripple formation on Ge(001) surfaces under near-normal ion beam sputteringD Carbone, A Alija, O Plantevin, et al.
Journal of Synchrotron Radiation|July 2, 2002
X-ray diffraction from rectangular slitsD Le Bolloc'h, F Livet, F Bley, et al.
Pageof 3