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Applied Optics
|
March 1, 1997
Structure and normal incidence soft-x-ray reflectivity of Ni-Nb/C amorphous multilayers
S Vitta, T H Metzger, J Peisl
Physical Review Letters
|
February 1, 2008
Defect cores investigated by x-ray scattering close to forbidden reflections in silicon
M-I Richard, T H Metzger, V Holý, et al.
Journal of Synchrotron Radiation
|
April 26, 2003
A focusing crystal analyser for the rejection of inelastic X-ray scattering
M A Hamilton, T H Metzger, A Mazuelas, et al.
Chemical Communications (Cambridge, England)
|
March 5, 2003
Pure silica BETA colloidal zeolite assembled in thin films
S Mintova, M Reinelt, T H Metzger, et al.
Chemphyschem : a European Journal of Chemical Physics and Physical Chemistry
|
October 27, 2009
X-ray diffraction as a local probe tool
J Stangl, C Mocuta, A Diaz, et al.
The Journal of Physical Chemistry. B
|
July 21, 2006
Ordered micro/mesoporous composite prepared as thin films
N Petkov, M Hölzl, T H Metzger, et al.
Physical Review Letters
|
May 23, 2006
Local structure of a rolled-up single crystal: an X-ray microdiffraction study of individual semiconductor nanotubes
B Krause, C Mocuta, T H Metzger, et al.
Journal of Physics. Condensed Matter : an Institute of Physics Journal
|
July 29, 2011
Nanoscale structures and dynamics of a boundary liquid layer
M Walz, S Gerth, P Falus, et al.
Nanotechnology
|
August 6, 2011
Early stage of ripple formation on Ge(001) surfaces under near-normal ion beam sputtering
D Carbone, A Alija, O Plantevin, et al.
Journal of Synchrotron Radiation
|
July 2, 2002
X-ray diffraction from rectangular slits
D Le Bolloc'h, F Livet, F Bley, et al.
Page
of 3
Search research articles
Search
Showing results (1-10 of 21) with videos related to
Sort By:
Page
of 3
Applied Optics
|
March 1, 1997
Structure and normal incidence soft-x-ray reflectivity of Ni-Nb/C amorphous multilayers
S Vitta, T H Metzger, J Peisl
Physical Review Letters
|
February 1, 2008
Defect cores investigated by x-ray scattering close to forbidden reflections in silicon
M-I Richard, T H Metzger, V Holý, et al.
Journal of Synchrotron Radiation
|
April 26, 2003
A focusing crystal analyser for the rejection of inelastic X-ray scattering
M A Hamilton, T H Metzger, A Mazuelas, et al.
Chemical Communications (Cambridge, England)
|
March 5, 2003
Pure silica BETA colloidal zeolite assembled in thin films
S Mintova, M Reinelt, T H Metzger, et al.
Chemphyschem : a European Journal of Chemical Physics and Physical Chemistry
|
October 27, 2009
X-ray diffraction as a local probe tool
J Stangl, C Mocuta, A Diaz, et al.
The Journal of Physical Chemistry. B
|
July 21, 2006
Ordered micro/mesoporous composite prepared as thin films
N Petkov, M Hölzl, T H Metzger, et al.
Physical Review Letters
|
May 23, 2006
Local structure of a rolled-up single crystal: an X-ray microdiffraction study of individual semiconductor nanotubes
B Krause, C Mocuta, T H Metzger, et al.
Journal of Physics. Condensed Matter : an Institute of Physics Journal
|
July 29, 2011
Nanoscale structures and dynamics of a boundary liquid layer
M Walz, S Gerth, P Falus, et al.
Nanotechnology
|
August 6, 2011
Early stage of ripple formation on Ge(001) surfaces under near-normal ion beam sputtering
D Carbone, A Alija, O Plantevin, et al.
Journal of Synchrotron Radiation
|
July 2, 2002
X-ray diffraction from rectangular slits
D Le Bolloc'h, F Livet, F Bley, et al.
Page
of 3