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Applied Optics|August 20, 2010
Infrared ellipsometer for the study of surfaces, thin films, and superlatticesJ Bremer, O Hunderi, K Fanping, et al.Optics Letters|November 17, 2007
Measurement of the nonlinear coefficient of orientation-patterned GaAs and demonstration of highly efficient second-harmonic generationT Skauli, K L Vodopyanov, T J Pinguet, et al.Optics Letters|November 23, 2007
Difference frequency generation of 8-microm radiation in orientation- patterned GaAsO Levi, T J Pinguet, T Skauli, et al.Pageof 1