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T Vermeij

Showing results (1-10 of 3) with videos related to

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Ultramicroscopy|May 18, 2018
A consistent full-field integrated DIC framework for HR-EBSDT Vermeij, J P M Hoefnagels
Ultramicroscopy|December 18, 2017
Preventing damage and redeposition during focused ion beam milling: The "umbrella" methodT Vermeij, E Plancher, C C Tasan
Science and Technology of Advanced Materials|March 16, 2026
Understanding strain localization in metallic materials: a review of high-resolution digital image correlation and related techniquesF Briffod, T E J Edwards, J Quinta da Fonseca, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|May 18, 2018
A consistent full-field integrated DIC framework for HR-EBSDT Vermeij, J P M Hoefnagels
Ultramicroscopy|December 18, 2017
Preventing damage and redeposition during focused ion beam milling: The "umbrella" methodT Vermeij, E Plancher, C C Tasan
Science and Technology of Advanced Materials|March 16, 2026
Understanding strain localization in metallic materials: a review of high-resolution digital image correlation and related techniquesF Briffod, T E J Edwards, J Quinta da Fonseca, et al.
Pageof 1