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Taehwan Moon

Showing results (11-20 of 22) with videos related to

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Nanoscale|December 16, 2017
Understanding the formation of the metastable ferroelectric phase in hafnia-zirconia solid solution thin filmsMin Hyuk Park, Young Hwan Lee, Han Joon Kim, et al.
ACS Applied Materials & Interfaces|May 31, 2016
Effect of Zr Content on the Wake-Up Effect in Hf1-xZrxO2 FilmsMin Hyuk Park, Han Joon Kim, Yu Jin Kim, et al.
Small (Weinheim an Der Bergstrasse, Germany)|April 4, 2022
Hybrid Deep Learning Crystallographic Mapping of Polymorphic Phases in Polycrystalline Hf<sub>0.5</sub> Zr<sub>0.5</sub> O<sub>2</sub> Thin FilmsYoung-Hoon Kim, Sang-Hyeok Yang, Myoungho Jeong, et al.
Advanced Materials (Deerfield Beach, Fla.)|February 14, 2015
Ferroelectricity and antiferroelectricity of doped thin HfO2-based filmsMin Hyuk Park, Young Hwan Lee, Han Joon Kim, et al.
Nano Letters|November 8, 2017
Voltage Drop in a Ferroelectric Single Layer Capacitor by Retarded Domain NucleationYu Jin Kim, Hyeon Woo Park, Seung Dam Hyun, et al.
Scientific Reports|February 12, 2016
Alternative interpretations for decreasing voltage with increasing charge in ferroelectric capacitorsSeul Ji Song, Yu Jin Kim, Min Hyuk Park, et al.
Small Science|April 11, 2025
Resetting the Drift of Oxygen Vacancies in Ultrathin HZO Ferroelectric Memories by Electrical Pulse EngineeringAtif Jan, Stephanie A Fraser, Taehwan Moon, et al.
Nano Letters|May 28, 2016
Time-Dependent Negative Capacitance Effects in Al2O3/BaTiO3 BilayersYu Jin Kim, Hiroyuki Yamada, Taehwan Moon, et al.
ACS Applied Materials & Interfaces|January 12, 2018
Composition, Microstructure, and Electrical Performance of Sputtered SnO Thin Films for p-Type Oxide SemiconductorSeung Jun Lee, Younjin Jang, Han Joon Kim, et al.
Nanoscale Research Letters|April 9, 2020
A Comparative Study on the Ferroelectric Performances in Atomic Layer Deposited Hf<sub>0.5</sub>Zr<sub>0.5</sub>O<sub>2</sub> Thin Films Using Tetrakis(ethylmethylamino) and Tetrakis(dimethylamino) PrecursorsBaek Su Kim, Seung Dam Hyun, Taehwan Moon, et al.
Pageof 3

Showing results (11-20 of 22) with videos related to

Sort By:
Pageof 3
Nanoscale|December 16, 2017
Understanding the formation of the metastable ferroelectric phase in hafnia-zirconia solid solution thin filmsMin Hyuk Park, Young Hwan Lee, Han Joon Kim, et al.
ACS Applied Materials & Interfaces|May 31, 2016
Effect of Zr Content on the Wake-Up Effect in Hf1-xZrxO2 FilmsMin Hyuk Park, Han Joon Kim, Yu Jin Kim, et al.
Small (Weinheim an Der Bergstrasse, Germany)|April 4, 2022
Hybrid Deep Learning Crystallographic Mapping of Polymorphic Phases in Polycrystalline Hf<sub>0.5</sub> Zr<sub>0.5</sub> O<sub>2</sub> Thin FilmsYoung-Hoon Kim, Sang-Hyeok Yang, Myoungho Jeong, et al.
Advanced Materials (Deerfield Beach, Fla.)|February 14, 2015
Ferroelectricity and antiferroelectricity of doped thin HfO2-based filmsMin Hyuk Park, Young Hwan Lee, Han Joon Kim, et al.
Nano Letters|November 8, 2017
Voltage Drop in a Ferroelectric Single Layer Capacitor by Retarded Domain NucleationYu Jin Kim, Hyeon Woo Park, Seung Dam Hyun, et al.
Scientific Reports|February 12, 2016
Alternative interpretations for decreasing voltage with increasing charge in ferroelectric capacitorsSeul Ji Song, Yu Jin Kim, Min Hyuk Park, et al.
Small Science|April 11, 2025
Resetting the Drift of Oxygen Vacancies in Ultrathin HZO Ferroelectric Memories by Electrical Pulse EngineeringAtif Jan, Stephanie A Fraser, Taehwan Moon, et al.
Nano Letters|May 28, 2016
Time-Dependent Negative Capacitance Effects in Al2O3/BaTiO3 BilayersYu Jin Kim, Hiroyuki Yamada, Taehwan Moon, et al.
ACS Applied Materials & Interfaces|January 12, 2018
Composition, Microstructure, and Electrical Performance of Sputtered SnO Thin Films for p-Type Oxide SemiconductorSeung Jun Lee, Younjin Jang, Han Joon Kim, et al.
Nanoscale Research Letters|April 9, 2020
A Comparative Study on the Ferroelectric Performances in Atomic Layer Deposited Hf<sub>0.5</sub>Zr<sub>0.5</sub>O<sub>2</sub> Thin Films Using Tetrakis(ethylmethylamino) and Tetrakis(dimethylamino) PrecursorsBaek Su Kim, Seung Dam Hyun, Taehwan Moon, et al.
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