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Journal of Nanoscience and Nanotechnology|July 23, 2011
Tensile elongation measurement device with in-plane bimorph actuation mechanismTakahiro Namazu, Hiroki Fujii, Shozo InoueUltramicroscopy|September 5, 2002
Mechanical property measurements of nanoscale structures using an atomic force microscopeSriram Sundararajan, Bharat Bhushan, Takahiro Namazu, et al.Materials (Basel, Switzerland)|September 16, 2020
Temperature Dependence on Tensile Mechanical Properties of Sintered Silver FilmKeisuke Wakamoto, Yo Mochizuki, Takukazu Otsuka, et al.Journal of Nanoscience and Nanotechnology|July 23, 2011
In-situ cathodoluminescence spectroscopy of silicon oxide thin film under uniaxial tensile loadingTakahiro Namazu, Naoaki Yamashita, Shigeru Kakinuma, et al.Nature Communications|July 12, 2019
Strength of carbon nanotubes depends on their chemical structuresAkira Takakura, Ko Beppu, Taishi Nishihara, et al.IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|January 24, 2017
Fabrication of Tetragonal Pb(Zr,Ti)O3 Nanorods by Focused Ion Beam and Characterization of the Domain StructureDaisuke Ito, Tomoaki Yamada, Osami Sakata, et al.Scientific Reports|June 29, 2016
Piezoresistive effect in p-type 3C-SiC at high temperatures characterized using Joule heatingHoang-Phuong Phan, Toan Dinh, Takahiro Kozeki, et al.Materials (Basel, Switzerland)|October 14, 2020
Cathodoluminescence Spectroscopic Stress Analysis for Silicon Oxide Film and Its Damage EvaluationShingo Kammachi, Yoshiharu Goshima, Nobutaka Goami, et al.Scientific Reports|July 14, 2017
Charge screening strategy for domain pattern control in nano-scale ferroelectric systemsTomoaki Yamada, Daisuke Ito, Tomas Sluka, et al.Pageof 1