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Journal of Nanoscience and Nanotechnology|July 23, 2011
Initial stages of high-temperature CaF2/Si(001) epitaxial growth studied by surface X-ray diffractionSergey M Suturin, Nikolai S Sokolov, Aleksander G Banshchikov, et al.
Journal of Nanoscience and Nanotechnology|July 23, 2011
Electronic structure characterization of La incorporated Hf-based high-k gate dielectrics by NEXAFSTakashi Yamamoto, Singo Ogawa, Masahiro Kunisu, et al.
Sensors (Basel, Switzerland)|December 5, 2020
Toward the Super Temporal Resolution Image Sensor with a Germanium Photodiode for Visible LightNguyen Hoai Ngo, Anh Quang Nguyen, Fabian M Bufler, et al.
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