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Takeshi Higashiguchi

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The Review of Scientific Instruments|January 3, 2017
Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nmThanh Hung Dinh, Yoshiki Kondo, Toshiki Tamura, et al.
The Review of Scientific Instruments|March 3, 2017
Publisher's Note: "Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm" [Rev. Sci. Instrum. 87, 123106 (2016)]Thanh Hung Dinh, Yoshiki Kondo, Toshiki Tamura, et al.
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Showing results (41-50 of 42) with videos related to

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The Review of Scientific Instruments|January 3, 2017
Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nmThanh Hung Dinh, Yoshiki Kondo, Toshiki Tamura, et al.
The Review of Scientific Instruments|March 3, 2017
Publisher's Note: "Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm" [Rev. Sci. Instrum. 87, 123106 (2016)]Thanh Hung Dinh, Yoshiki Kondo, Toshiki Tamura, et al.
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