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ACS Nano|March 7, 2020
Atomic-Scale Patterning of Arsenic in Silicon by Scanning Tunneling MicroscopyTaylor J Z Stock, Oliver Warschkow, Procopios C Constantinou, et al.Advanced Science (Weinheim, Baden-Wurttemberg, Germany)|July 20, 2023
Momentum-Space Imaging of Ultra-Thin Electron Liquids in δ-Doped SiliconProcopios Constantinou, Taylor J Z Stock, Eleanor Crane, et al.Small Methods|May 1, 2024
Benchmarking of X-Ray Fluorescence Microscopy with Ion Beam Implanted Samples Showing Detection Sensitivity of Hundreds of AtomsMateus G Masteghin, Toussaint Gervais, Steven K Clowes, et al.Advanced Science (Weinheim, Baden-Wurttemberg, Germany)|April 9, 2026
Interfacial Engineering by Metallic Ions and Organic Ammonium Ligand Passivation for Perovskite Solar CellsAbraham Adenle, Purevlkham Myagmarsereejid, Selengesuren Suragtkhuu, et al.Pageof 2