Teppei Oyobe - JoVE Visualize

Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Filters

Teppei Oyobe

Showing results (1-10 of 1) with videos related to

Pageof 1

Sort By:

Microscopy (Oxford, England)|September 20, 2024

Surface sensitivity of atomic-resolution secondary electron imagingKoh Saitoh, Teppei Oyobe, Keisuke Igarashi, et al.

Pageof 1

Search research articles

Showing results (1-10 of 1) with videos related to

Sort By:

Pageof 1

Microscopy (Oxford, England)|September 20, 2024

Surface sensitivity of atomic-resolution secondary electron imagingKoh Saitoh, Teppei Oyobe, Keisuke Igarashi, et al.

Pageof 1