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Thilo Glatzel

Showing results (11-20 of 74) with videos related to

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Beilstein Journal of Nanotechnology|October 7, 2011
The role of the cantilever in Kelvin probe force microscopy measurementsGeorge Elias, Thilo Glatzel, Ernst Meyer, et al.
Beilstein Journal of Nanotechnology|July 5, 2021
Influence of electrospray deposition on C<sub>60</sub> molecular assembliesAntoine Hinaut, Sebastian Scherb, Sara Freund, et al.
Nanotechnology|November 7, 2009
Modulation of contact resonance frequency accompanying atomic-scale stick-slip in friction force microscopyPascal Steiner, Raphael Roth, Enrico Gnecco, et al.
Beilstein Journal of Nanotechnology|July 23, 2015
Transformations of PTCDA structures on rutile TiO2 induced by thermal annealing and intermolecular forcesSzymon Godlewski, Jakub S Prauzner-Bechcicki, Thilo Glatzel, et al.
Physical Review Letters|April 7, 2010
Systematic achievement of improved atomic-scale contrast via bimodal dynamic force microscopyShigeki Kawai, Thilo Glatzel, Sascha Koch, et al.
Beilstein Journal of Nanotechnology|October 7, 2011
Oriented growth of porphyrin-based molecular wires on ionic crystals analysed by nc-AFMThilo Glatzel, Lars Zimmerli, Shigeki Kawai, et al.
Beilstein Journal of Nanotechnology|January 21, 2022
Topographic signatures and manipulations of Fe atoms, CO molecules and NaCl islands on superconducting Pb(111)Carl Drechsel, Philipp D'Astolfo, Jung-Ching Liu, et al.
Nanotechnology|January 7, 2012
Interplay of the tip-sample junction stability and image contrast reversal on a Cu(111) surface revealed by the 3D force fieldBartosz Such, Thilo Glatzel, Shigeki Kawai, et al.
Beilstein Journal of Nanotechnology|February 1, 2013
Advanced atomic force microscopy techniquesThilo Glatzel, Hendrik Hölscher, Thomas Schimmel, et al.
Beilstein Journal of Nanotechnology|February 18, 2016
Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devicesUrs Gysin, Thilo Glatzel, Thomas Schmölzer, et al.
Pageof 8

Showing results (11-20 of 74) with videos related to

Sort By:
Pageof 8
Beilstein Journal of Nanotechnology|October 7, 2011
The role of the cantilever in Kelvin probe force microscopy measurementsGeorge Elias, Thilo Glatzel, Ernst Meyer, et al.
Beilstein Journal of Nanotechnology|July 5, 2021
Influence of electrospray deposition on C<sub>60</sub> molecular assembliesAntoine Hinaut, Sebastian Scherb, Sara Freund, et al.
Nanotechnology|November 7, 2009
Modulation of contact resonance frequency accompanying atomic-scale stick-slip in friction force microscopyPascal Steiner, Raphael Roth, Enrico Gnecco, et al.
Beilstein Journal of Nanotechnology|July 23, 2015
Transformations of PTCDA structures on rutile TiO2 induced by thermal annealing and intermolecular forcesSzymon Godlewski, Jakub S Prauzner-Bechcicki, Thilo Glatzel, et al.
Physical Review Letters|April 7, 2010
Systematic achievement of improved atomic-scale contrast via bimodal dynamic force microscopyShigeki Kawai, Thilo Glatzel, Sascha Koch, et al.
Beilstein Journal of Nanotechnology|October 7, 2011
Oriented growth of porphyrin-based molecular wires on ionic crystals analysed by nc-AFMThilo Glatzel, Lars Zimmerli, Shigeki Kawai, et al.
Beilstein Journal of Nanotechnology|January 21, 2022
Topographic signatures and manipulations of Fe atoms, CO molecules and NaCl islands on superconducting Pb(111)Carl Drechsel, Philipp D'Astolfo, Jung-Ching Liu, et al.
Nanotechnology|January 7, 2012
Interplay of the tip-sample junction stability and image contrast reversal on a Cu(111) surface revealed by the 3D force fieldBartosz Such, Thilo Glatzel, Shigeki Kawai, et al.
Beilstein Journal of Nanotechnology|February 1, 2013
Advanced atomic force microscopy techniquesThilo Glatzel, Hendrik Hölscher, Thomas Schimmel, et al.
Beilstein Journal of Nanotechnology|February 18, 2016
Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devicesUrs Gysin, Thilo Glatzel, Thomas Schmölzer, et al.
Pageof 8