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Thomas Deselaers

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IEEE Transactions on Pattern Analysis and Machine Intelligence|January 18, 2012
Measuring the objectness of image windowsBogdan Alexe, Thomas Deselaers, Vittorio Ferrari
IEEE Transactions on Pattern Analysis and Machine Intelligence|June 15, 2007
Deformation models for image recognitionDaniel Keysers, Thomas Deselaers, Christian Gollan, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|November 9, 2011
Latent log-linear models for handwritten digit classificationThomas Deselaers, Tobias Gass, Georg Heigold, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|June 1, 2016
Multi-Language Online Handwriting RecognitionDaniel Keysers, Thomas Deselaers, Henry A Rowley, et al.
Computerized Medical Imaging and Graphics : the Official Journal of the Computerized Medical Imaging Society|March 10, 2005
Automatic categorization of medical images for content-based retrieval and data miningThomas M Lehmann, Mark O Güld, Thomas Deselaers, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
IEEE Transactions on Pattern Analysis and Machine Intelligence|January 18, 2012
Measuring the objectness of image windowsBogdan Alexe, Thomas Deselaers, Vittorio Ferrari
IEEE Transactions on Pattern Analysis and Machine Intelligence|June 15, 2007
Deformation models for image recognitionDaniel Keysers, Thomas Deselaers, Christian Gollan, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|November 9, 2011
Latent log-linear models for handwritten digit classificationThomas Deselaers, Tobias Gass, Georg Heigold, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|June 1, 2016
Multi-Language Online Handwriting RecognitionDaniel Keysers, Thomas Deselaers, Henry A Rowley, et al.
Computerized Medical Imaging and Graphics : the Official Journal of the Computerized Medical Imaging Society|March 10, 2005
Automatic categorization of medical images for content-based retrieval and data miningThomas M Lehmann, Mark O Güld, Thomas Deselaers, et al.
Pageof 1