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Thomas F K Weatherley

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Materials (Basel, Switzerland)|September 26, 2018
Characterisation of InGaN by Photoconductive Atomic Force MicroscopyThomas F K Weatherley, Fabien C-P Massabuau, Menno J Kappers, et al.
Nano Letters|August 12, 2024
GaN Surface Passivation by MoS<sub>2</sub> CoatingDanxuan Chen, Jin Jiang, Thomas F K Weatherley, et al.
Nano Letters|June 4, 2021
Imaging Nonradiative Point Defects Buried in Quantum Wells Using CathodoluminescenceThomas F K Weatherley, Wei Liu, Vitaly Osokin, et al.
Nanomaterials (Basel, Switzerland)|September 28, 2023
Investigation of the Impact of Point Defects in InGaN/GaN Quantum Wells with High Dislocation DensitiesPierre Lottigier, Davide Maria Di Paola, Duncan T L Alexander, et al.
Pageof 1

Showing results (1-10 of 4) with videos related to

Sort By:
Pageof 1
Materials (Basel, Switzerland)|September 26, 2018
Characterisation of InGaN by Photoconductive Atomic Force MicroscopyThomas F K Weatherley, Fabien C-P Massabuau, Menno J Kappers, et al.
Nano Letters|August 12, 2024
GaN Surface Passivation by MoS<sub>2</sub> CoatingDanxuan Chen, Jin Jiang, Thomas F K Weatherley, et al.
Nano Letters|June 4, 2021
Imaging Nonradiative Point Defects Buried in Quantum Wells Using CathodoluminescenceThomas F K Weatherley, Wei Liu, Vitaly Osokin, et al.
Nanomaterials (Basel, Switzerland)|September 28, 2023
Investigation of the Impact of Point Defects in InGaN/GaN Quantum Wells with High Dislocation DensitiesPierre Lottigier, Davide Maria Di Paola, Duncan T L Alexander, et al.
Pageof 1