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Thomas Gemming

Showing results (1-10 of 88) with videos related to

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Materials (Basel, Switzerland)|May 25, 2024
Study of the Long-Term High-Temperature Structural Stability of RuAl Electrodes for Microelectronic DevicesMarietta Seifert, Barbara Leszczynska, Thomas Gemming
Micron (Oxford, England : 1993)|June 25, 2013
Density measurement of thin layers by electron energy loss spectroscopy (EELS)Jürgen Thomas, Jürgen Ramm, Thomas Gemming
Ultramicroscopy|November 26, 2008
The statistics of the thermal motion of the atoms during imaging process in transmission electron microscopy and related techniquesAxel Rother, Thomas Gemming, Hannes Lichte
Journal of Bone and Mineral Metabolism|February 3, 2020
Contribution to understand the biomineralization of bonesJürgen Thomas, Hartmut Worch, Benjamin Kruppke, et al.
The Journal of Physical Chemistry Letters|September 29, 2021
Semiconductor-Based Microswimmers: Attention to Detail MattersMartin Wittmann, Astrid Ali, Thomas Gemming, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 23, 2009
Mn valency at La 0.7 Sr 0.3 MnO 3/SrTiO 3 (0 0 1) thin film interfacesThomas Riedl, Thomas Gemming, Kathrin Dörr, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|December 29, 2020
Study of Active Janus Particles in the Presence of an Engineered Oil-Water InterfacePriyanka Sharan, Witold Postek, Thomas Gemming, et al.
Chemistry (Weinheim an Der Bergstrasse, Germany)|August 28, 2010
Sexithiophene encapsulated in a single-walled carbon nanotube: an in situ Raman spectroelectrochemical study of a peapod structureMartin Kalbáč, Ladislav Kavan, Sandeep Gorantla, et al.
Materials (Basel, Switzerland)|December 1, 2017
Evaluation of Surface Cleaning Procedures for CTGS Substrates for SAW Technology with XPSErik Brachmann, Marietta Seifert, Steffen Oswald, et al.
Materials (Basel, Switzerland)|May 1, 2020
Phase Formation and High-Temperature Stability of Very Thin Co-Sputtered Ti-Al and Multilayered Ti/Al Films on Thermally Oxidized Si SubstratesMarietta Seifert, Eric Lattner, Siegfried B Menzel, et al.
Pageof 9

Showing results (1-10 of 88) with videos related to

Sort By:
Pageof 9
Materials (Basel, Switzerland)|May 25, 2024
Study of the Long-Term High-Temperature Structural Stability of RuAl Electrodes for Microelectronic DevicesMarietta Seifert, Barbara Leszczynska, Thomas Gemming
Micron (Oxford, England : 1993)|June 25, 2013
Density measurement of thin layers by electron energy loss spectroscopy (EELS)Jürgen Thomas, Jürgen Ramm, Thomas Gemming
Ultramicroscopy|November 26, 2008
The statistics of the thermal motion of the atoms during imaging process in transmission electron microscopy and related techniquesAxel Rother, Thomas Gemming, Hannes Lichte
Journal of Bone and Mineral Metabolism|February 3, 2020
Contribution to understand the biomineralization of bonesJürgen Thomas, Hartmut Worch, Benjamin Kruppke, et al.
The Journal of Physical Chemistry Letters|September 29, 2021
Semiconductor-Based Microswimmers: Attention to Detail MattersMartin Wittmann, Astrid Ali, Thomas Gemming, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 23, 2009
Mn valency at La 0.7 Sr 0.3 MnO 3/SrTiO 3 (0 0 1) thin film interfacesThomas Riedl, Thomas Gemming, Kathrin Dörr, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|December 29, 2020
Study of Active Janus Particles in the Presence of an Engineered Oil-Water InterfacePriyanka Sharan, Witold Postek, Thomas Gemming, et al.
Chemistry (Weinheim an Der Bergstrasse, Germany)|August 28, 2010
Sexithiophene encapsulated in a single-walled carbon nanotube: an in situ Raman spectroelectrochemical study of a peapod structureMartin Kalbáč, Ladislav Kavan, Sandeep Gorantla, et al.
Materials (Basel, Switzerland)|December 1, 2017
Evaluation of Surface Cleaning Procedures for CTGS Substrates for SAW Technology with XPSErik Brachmann, Marietta Seifert, Steffen Oswald, et al.
Materials (Basel, Switzerland)|May 1, 2020
Phase Formation and High-Temperature Stability of Very Thin Co-Sputtered Ti-Al and Multilayered Ti/Al Films on Thermally Oxidized Si SubstratesMarietta Seifert, Eric Lattner, Siegfried B Menzel, et al.
Pageof 9