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ABOUT JoVE

Overview Leadership Blog JoVE Help Center

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Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

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JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

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Tianquan Su

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Applied Optics|May 14, 2015

Instrument transfer function of slope measuring deflectometry systemsTianquan Su, Alejandro Maldonado, Peng Su, et al.

Applied Optics|November 13, 2013

Measuring rough optical surfaces using scanning long-wave optical test system. 1. Principle and implementationTianquan Su, Shanshan Wang, Robert E Parks, et al.

Optics Letters|May 2, 2018

Model-free deflectometry for freeform optics measurement using an iterative reconstruction techniqueLogan R Graves, Heejoo Choi, Wenchuan Zhao, et al.

Pageof 1

Search research articles

Showing results (1-10 of 3) with videos related to

Sort By:

Pageof 1

Applied Optics|May 14, 2015

Instrument transfer function of slope measuring deflectometry systemsTianquan Su, Alejandro Maldonado, Peng Su, et al.

Applied Optics|November 13, 2013

Measuring rough optical surfaces using scanning long-wave optical test system. 1. Principle and implementationTianquan Su, Shanshan Wang, Robert E Parks, et al.

Optics Letters|May 2, 2018

Model-free deflectometry for freeform optics measurement using an iterative reconstruction techniqueLogan R Graves, Heejoo Choi, Wenchuan Zhao, et al.

Pageof 1