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ABOUT JoVE

Overview Leadership Blog JoVE Help Center

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Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

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Testimonials Subscriptions Access Resources Library Advisory Board FAQ

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JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

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Tim Grieb

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Ultramicroscopy|May 25, 2016

Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopyKnut Müller-Caspary, Florian F Krause, Tim Grieb, et al.

Ultramicroscopy|June 27, 2021

4D-STEM at interfaces to GaN: Centre-of-mass approach & NBED-disc detectionTim Grieb, Florian F Krause, Knut Müller-Caspary, et al.

Scientific Reports|June 29, 2016

Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron DiffractionDaniel Carvalho, Knut Müller-Caspary, Marco Schowalter, et al.

Discover Nano|March 1, 2023

Correlative analysis on InGaN/GaN nanowires: structural and optical properties of self-assembled short-period superlatticesManuel Alonso-Orts, Rudolfo Hötzel, Tim Grieb, et al.

Scientific Reports|April 11, 2014

Coherently embedded Ag nanostructures in Si: 3D imaging and their application to SERSR R Juluri, A Rath, A Ghosh, et al.

Nanoscale|March 29, 2023

Origin of the spectral red-shift and polarization patterns of self-assembled InGaN nanostructures on GaN nanowiresMaximilian Ries, Felix Nippert, Benjamin März, et al.

Pageof 4

Search research articles

Showing results (31-40 of 36) with videos related to

Sort By:

Pageof 4

You have reached the last page of results.This site can display upto 36 results.

Ultramicroscopy|May 25, 2016

Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopyKnut Müller-Caspary, Florian F Krause, Tim Grieb, et al.

Ultramicroscopy|June 27, 2021

4D-STEM at interfaces to GaN: Centre-of-mass approach & NBED-disc detectionTim Grieb, Florian F Krause, Knut Müller-Caspary, et al.

Scientific Reports|June 29, 2016

Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron DiffractionDaniel Carvalho, Knut Müller-Caspary, Marco Schowalter, et al.

Discover Nano|March 1, 2023

Correlative analysis on InGaN/GaN nanowires: structural and optical properties of self-assembled short-period superlatticesManuel Alonso-Orts, Rudolfo Hötzel, Tim Grieb, et al.

Scientific Reports|April 11, 2014

Coherently embedded Ag nanostructures in Si: 3D imaging and their application to SERSR R Juluri, A Rath, A Ghosh, et al.

Nanoscale|March 29, 2023

Origin of the spectral red-shift and polarization patterns of self-assembled InGaN nanostructures on GaN nanowiresMaximilian Ries, Felix Nippert, Benjamin März, et al.

Pageof 4