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Materials (Basel, Switzerland)|December 24, 2021
Effect of Inhomogeneous Broadening in Ultraviolet III-Nitride Light-Emitting DiodesFriedhard Römer, Martin Guttmann, Tim Wernicke, et al.
Nanotechnology|April 28, 2026
Controlling point defect populations in AlGaN deep UV LEDsDouglas Cameron, Viesturs Spūlis, Marcel Schilling, et al.
ACS Photonics|February 23, 2023
Increased Light Extraction of Thin-Film Flip-Chip UVB LEDs by Surface TexturingMichael A Bergmann, Johannes Enslin, Martin Guttmann, et al.
ACS Photonics|August 26, 2024
Ultraviolet-B Resonant-Cavity Light-Emitting Diodes with Tunnel Junctions and Dielectric MirrorsEstrella Torres, Joachim Ciers, Michael A Bergmann, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 5, 2021
Quantification of Trace-Level Silicon Doping in Al Ga1-N Films Using Wavelength-Dispersive X-Ray MicroanalysisLucia Spasevski, Ben Buse, Paul R Edwards, et al.
Nano Letters|February 7, 2023
Core-Shell Nanorods as Ultraviolet Light-Emitting DiodesDouglas Cameron, Pierre-Marie Coulon, Simon Fairclough, et al.
ACS Photonics|January 28, 2021
A 310 nm Optically Pumped AlGaN Vertical-Cavity Surface-Emitting LaserFilip Hjort, Johannes Enslin, Munise Cobet, et al.
Scientific Reports|April 18, 2025
Modeling the capacitance-voltage characteristics of AlGaN-based UV-C LEDsNicola Roccato, Francesco Piva, Matteo Buffolo, et al.
Scientific Reports|November 12, 2025
Diffusion mechanism as cause of optical degradation in AlGaN-based UV-C leds investigated by TCAD simulationsNicola Roccato, Francesco Piva, Matteo Buffolo, et al.
Microsystems & Nanoengineering|December 10, 2019
Displacement Talbot lithography for nano-engineering of III-nitride materialsPierre-Marie Coulon, Benjamin Damilano, Blandine Alloing, et al.
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