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Timothy J Ruggles

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 5, 2017
Selectively Electron-Transparent Microstamping Toward Concurrent Digital Image Correlation and High-Angular Resolution Electron Backscatter Diffraction (EBSD) AnalysisTimothy J Ruggles, Geoffrey F Bomarito, Andrew H Cannon, et al.
Ultramicroscopy|September 10, 2017
Comparison of dislocation characterization by electron channeling contrast imaging and cross-correlation electron backscattered diffractionBret E Dunlap, Timothy J Ruggles, David T Fullwood, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 16, 2021
Identification of Star Defects in Gallium Nitride with HREBSD and ECCITimothy J Ruggles, Julia I Deitz, Andrew A Allerman, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 25, 2023
Characterization of Anomalous Grains in FeCo Magnetic AlloysJulia I Deitz, Timothy J Ruggles, Philip J Noell, et al.
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Showing results (1-10 of 4) with videos related to

Sort By:
Pageof 1
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 5, 2017
Selectively Electron-Transparent Microstamping Toward Concurrent Digital Image Correlation and High-Angular Resolution Electron Backscatter Diffraction (EBSD) AnalysisTimothy J Ruggles, Geoffrey F Bomarito, Andrew H Cannon, et al.
Ultramicroscopy|September 10, 2017
Comparison of dislocation characterization by electron channeling contrast imaging and cross-correlation electron backscattered diffractionBret E Dunlap, Timothy J Ruggles, David T Fullwood, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 16, 2021
Identification of Star Defects in Gallium Nitride with HREBSD and ECCITimothy J Ruggles, Julia I Deitz, Andrew A Allerman, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 25, 2023
Characterization of Anomalous Grains in FeCo Magnetic AlloysJulia I Deitz, Timothy J Ruggles, Philip J Noell, et al.
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