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Frontiers in Plant Science|July 18, 2024
Exploring the genetic architecture of powdery mildew resistance in wheat through QTL meta-analysisDivya Sharma, Neeraj Budhlakoti, Anita Kumari, et al.
Plos One|October 5, 2020
Genetic characterization for lesion mimic and other traits in relation to spot blotch resistance in spring wheatShweta Singh, Vinod Kumar Mishra, Ravindra Nath Kharwar, et al.
The Plant Genome|April 14, 2026
Wheat's war against stripe rust: Integrating host immunity, genomics and breeding for durable resistanceFarkhandah Jan, Mukesh Rathore, Dinesh Kumar Saini, et al.
Frontiers in Plant Science|May 8, 2026
Genome-wide association studies and candidate gene identification under salinity stress in bread wheat (<i>Triticum aestivum</i> L.)B Jagadhesan, Harish Chandra Singh, Sujata Thakur, et al.
Molecular Biology Reports|February 24, 2023
Recent advances on genome-wide association studies (GWAS) and genomic selection (GS); prospects for Fusarium head blight research in Durum wheatZahoor Ahmad Mir, Tilak Chandra, Anurag Saharan, et al.
Frontiers in Plant Science|August 31, 2023
Genome-wide identification and characterization of <i>Puccinia striiformis</i>-responsive lncRNAs in <i>Triticum aestivum</i>Parinita Das, Monendra Grover, Dwijesh Chandra Mishra, et al.
BMC Plant Biology|April 1, 2025
Genetic dissection of leaf rust resistance in a diversity panel of tetraploid wheat (Triticum turgidum)Jitendra Kumar Yadav, Shruti Sinha, Hariom Shukla, et al.
Frontiers in Plant Science|October 12, 2020
Genome-Wide Association Study Reveals Genomic Regions Associated With Ten Agronomical Traits in Wheat Under Late-Sown ConditionsSundeep Kumar, Jyoti Kumari, Nabin Bhusal, et al.
Briefings in Bioinformatics|July 14, 2026
OptimGS: a dual integrative genomic prediction framework for improving cold stress tolerance in wheatPrabina Kumar Meher, Farkhandah Jan, Nelofer Jan, et al.
BMC Plant Biology|February 28, 2025
Unraveling the genetic basis of heat tolerance and yield in bread wheat: QTN discovery and Its KASP-assisted validationLatief Bashir, Neeraj Budhlakoti, Anjan Kumar Pradhan, et al.
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