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Nanoscale Advances
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March 31, 2023
Mapping complex profiles of light intensity with interferometric lithography
Joseph Holmes, Mi Zhang, Tine Greibe, et al.
ACS Nano
|
May 2, 2022
In-Plane, In-Series Nanopores with Circular Cross Sections for Resistive-Pulse Sensing
Mi Zhang, Zachary D Harms, Tine Greibe, et al.
Springerplus
|
July 28, 2016
Correlation between Al grain size, grain boundary grooves and local variations in oxide barrier thickness of Al/AlOx/Al tunnel junctions by transmission electron microscopy
Samira Nik, Philip Krantz, Lunjie Zeng, et al.
Physical Review Letters
|
March 17, 2011
Are "pinholes" the cause of excess current in superconducting tunnel junctions? A study of Andreev current in highly resistive junctions
Tine Greibe, Markku P V Stenberg, C M Wilson, et al.
Page
of 1
Search research articles
Search
Showing results (1-10 of 4) with videos related to
Sort By:
Page
of 1
Nanoscale Advances
|
March 31, 2023
Mapping complex profiles of light intensity with interferometric lithography
Joseph Holmes, Mi Zhang, Tine Greibe, et al.
ACS Nano
|
May 2, 2022
In-Plane, In-Series Nanopores with Circular Cross Sections for Resistive-Pulse Sensing
Mi Zhang, Zachary D Harms, Tine Greibe, et al.
Springerplus
|
July 28, 2016
Correlation between Al grain size, grain boundary grooves and local variations in oxide barrier thickness of Al/AlOx/Al tunnel junctions by transmission electron microscopy
Samira Nik, Philip Krantz, Lunjie Zeng, et al.
Physical Review Letters
|
March 17, 2011
Are "pinholes" the cause of excess current in superconducting tunnel junctions? A study of Andreev current in highly resistive junctions
Tine Greibe, Markku P V Stenberg, C M Wilson, et al.
Page
of 1