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Beilstein Journal of Nanotechnology|June 24, 2016
Length-extension resonator as a force sensor for high-resolution frequency-modulation atomic force microscopy in airHannes Beyer, Tino Wagner, Andreas StemmerBeilstein Journal of Nanotechnology|June 30, 2020
Measurement of electrostatic tip-sample interactions by time-domain Kelvin probe force microscopyChristian Ritz, Tino Wagner, Andreas StemmerBeilstein Journal of Nanotechnology|February 15, 2018
Combined scanning probe electronic and thermal characterization of an indium arsenide nanowireTino Wagner, Fabian Menges, Heike Riel, et al.Beilstein Journal of Nanotechnology|January 7, 2016
Kelvin probe force microscopy for local characterisation of active nanoelectronic devicesTino Wagner, Hannes Beyer, Patrick Reissner, et al.ACS Applied Materials & Interfaces|July 27, 2017
Visualizing Local Morphology and Conductivity Switching in Interface-Assembled Nanoporous C<sub>60</sub> Thin FilmsJean-Nicolas Tisserant, Tino Wagner, Patrick A Reissner, et al.Nanotechnology|August 21, 2015
Contact transfer length investigation of a 2D nanoparticle network by scanning probe microscopyCarlos S Ruiz-Vargas, Patrick A Reissner, Tino Wagner, et al.Nature Materials|November 14, 2018
Large Pockels effect in micro- and nanostructured barium titanate integrated on siliconStefan Abel, Felix Eltes, J Elliott Ortmann, et al.Pageof 1