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Todd Zickler

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IEEE Transactions on Pattern Analysis and Machine Intelligence|January 30, 2024

Ref-NeRF: Structured View-Dependent Appearance for Neural Radiance FieldsDor Verbin, Peter Hedman, Ben Mildenhall, et al.

Proceedings of the National Academy of Sciences of the United States of America|October 30, 2019

Compact single-shot metalens depth sensors inspired by eyes of jumping spidersQi Guo, Zhujun Shi, Yao-Wei Huang, et al.

IEEE Transactions on Pattern Analysis and Machine Intelligence|October 19, 2013

Toward wide-angle microvision sensorsSanjeev J Koppal, Ioannis Gkioulekas, Travis Young, et al.

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Search research articles

Showing results (11-20 of 13) with videos related to

Sort By:

Pageof 2

You have reached the last page of results.This site can display upto 13 results.

IEEE Transactions on Pattern Analysis and Machine Intelligence|January 30, 2024

Ref-NeRF: Structured View-Dependent Appearance for Neural Radiance FieldsDor Verbin, Peter Hedman, Ben Mildenhall, et al.

Proceedings of the National Academy of Sciences of the United States of America|October 30, 2019

Compact single-shot metalens depth sensors inspired by eyes of jumping spidersQi Guo, Zhujun Shi, Yao-Wei Huang, et al.

IEEE Transactions on Pattern Analysis and Machine Intelligence|October 19, 2013

Toward wide-angle microvision sensorsSanjeev J Koppal, Ioannis Gkioulekas, Travis Young, et al.

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