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The Review of Scientific Instruments
|
April 7, 2007
Feedback system for improving the performance of extended x-ray absorption fine structure measurements
Togo Kudo, Hajime Tanida
The Review of Scientific Instruments
|
October 2, 2009
Vacuum-compatible pulse selector for free-electron laser
Togo Kudo, Toko Hirono, Mitsuru Nagasono, et al.
The Review of Scientific Instruments
|
September 3, 2016
New x-ray pink-beam profile monitor system for the SPring-8 beamline front-end
Sunao Takahashi, Togo Kudo, Mutsumi Sano, et al.
The Review of Scientific Instruments
|
April 9, 2020
Energy-resolved beam-monitoring system for undulator radiation using scattering from a chemical-vapor-deposition diamond film
Togo Kudo, Mutsumi Sano, Toshiro Itoga, et al.
Journal of Synchrotron Radiation
|
May 5, 2022
An X-ray beam profile monitoring system at a beamline front-end combining a single-crystal diamond film and energy discrimination using droplet analysis
Togo Kudo, Mutsumi Sano, Takahiro Matsumoto, et al.
Journal of Synchrotron Radiation
|
April 22, 2025
Method for visualizing detailed profiles of synchrotron X-ray beams using diamond-thin films and silicon drift detectors
Togo Kudo, Shinji Suzuki, Mutsumi Sano, et al.
The Review of Scientific Instruments
|
March 3, 2011
Single-shot beam-position monitor for x-ray free electron laser
Kensuke Tono, Togo Kudo, Makina Yabashi, et al.
Journal of Synchrotron Radiation
|
September 3, 2021
Development and application of a tender X-ray ptychographic coherent diffraction imaging system on BL27SU at SPring-8
Masaki Abe, Fusae Kaneko, Nozomu Ishiguro, et al.
Optics Letters
|
March 16, 2019
Development of an X-ray imaging detector to resolve 200 nm line-and-space patterns by using transparent ceramics layers bonded by solid-state diffusion
Takashi Kameshima, Akihisa Takeuchi, Kentaro Uesugi, et al.
Optics Express
|
August 19, 2018
Advancement of X-ray radiography using microfocus X-ray source in conjunction with amplitude grating and SOI pixel detector, SOPHIAS
Ryo Hosono, Tomoki Kawabata, Kiyoshi Hayashida, et al.
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of 2
Search research articles
Search
Showing results (1-10 of 12) with videos related to
Sort By:
Page
of 2
The Review of Scientific Instruments
|
April 7, 2007
Feedback system for improving the performance of extended x-ray absorption fine structure measurements
Togo Kudo, Hajime Tanida
The Review of Scientific Instruments
|
October 2, 2009
Vacuum-compatible pulse selector for free-electron laser
Togo Kudo, Toko Hirono, Mitsuru Nagasono, et al.
The Review of Scientific Instruments
|
September 3, 2016
New x-ray pink-beam profile monitor system for the SPring-8 beamline front-end
Sunao Takahashi, Togo Kudo, Mutsumi Sano, et al.
The Review of Scientific Instruments
|
April 9, 2020
Energy-resolved beam-monitoring system for undulator radiation using scattering from a chemical-vapor-deposition diamond film
Togo Kudo, Mutsumi Sano, Toshiro Itoga, et al.
Journal of Synchrotron Radiation
|
May 5, 2022
An X-ray beam profile monitoring system at a beamline front-end combining a single-crystal diamond film and energy discrimination using droplet analysis
Togo Kudo, Mutsumi Sano, Takahiro Matsumoto, et al.
Journal of Synchrotron Radiation
|
April 22, 2025
Method for visualizing detailed profiles of synchrotron X-ray beams using diamond-thin films and silicon drift detectors
Togo Kudo, Shinji Suzuki, Mutsumi Sano, et al.
The Review of Scientific Instruments
|
March 3, 2011
Single-shot beam-position monitor for x-ray free electron laser
Kensuke Tono, Togo Kudo, Makina Yabashi, et al.
Journal of Synchrotron Radiation
|
September 3, 2021
Development and application of a tender X-ray ptychographic coherent diffraction imaging system on BL27SU at SPring-8
Masaki Abe, Fusae Kaneko, Nozomu Ishiguro, et al.
Optics Letters
|
March 16, 2019
Development of an X-ray imaging detector to resolve 200 nm line-and-space patterns by using transparent ceramics layers bonded by solid-state diffusion
Takashi Kameshima, Akihisa Takeuchi, Kentaro Uesugi, et al.
Optics Express
|
August 19, 2018
Advancement of X-ray radiography using microfocus X-ray source in conjunction with amplitude grating and SOI pixel detector, SOPHIAS
Ryo Hosono, Tomoki Kawabata, Kiyoshi Hayashida, et al.
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of 2