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Faraday Discussions|July 6, 2018
A study of dynamic nanoscale corrosion initiation events using HS-AFMStacy Moore, Robert Burrows, Loren Picco, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 1, 2015
Practical Issues for Atom Probe Tomography Analysis of III-Nitride Semiconductor MaterialsFengzai Tang, Michael P Moody, Tomas L Martin, et al.
Ultramicroscopy|February 2, 2021
Sample preparation methods for optimal HS-AFM analysis: Duplex stainless steelStacy Moore, Alexander D Warren, Robert Burrows, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 27, 2017
Comparing the Consistency of Atom Probe Tomography Measurements of Small-Scale Segregation and Clustering Between the LEAP 3000 and LEAP 5000 InstrumentsTomas L Martin, Andrew J London, Benjamin Jenkins, et al.
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