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Micron (Oxford, England : 1993)|May 1, 2012
Position-controlled marker formation by helium ion microscope for aligning a TEM tomographic tilt seriesMisa Hayashida, Tomohiko Iijima, Toshiyuki Fujimoto, et al.ACS Nano|June 22, 2013
Conduction tuning of graphene based on defect-induced localizationShu Nakaharai, Tomohiko Iijima, Shinichi Ogawa, et al.Pageof 1