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Ultramicroscopy|August 23, 2005
Conductive transparent fiber probes for shear-force atomic force microscopesTooru Murashita
Nanotechnology|May 8, 2009
Optical and electrical characterization at the nanoscale with a transparent probe of a scanning tunnelling microscopeIlya Sychugov, Hiroo Omi, Tooru Murashita, et al.
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