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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 26, 2012
Atom probe tomography simulations and density functional theory calculations of bonding energies in Cu3AuTorben Boll, Zhi-Yong Zhu, Talaat Al-Kassab, et al.ACS Nano|October 30, 2023
Challenging Prevalent Solid Electrolyte Interphase (SEI) Models: An Atom Probe Tomography Study on a Commercial Graphite ElectrodeIsabel Pantenburg, Marvin Cronau, Torben Boll, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 21, 2017
Interfaces in Oxides Formed on NiAlCr Doped with Y, Hf, Ti, and BTorben Boll, Kinga A Unocic, Bruce A Pint, et al.Materials (Basel, Switzerland)|December 23, 2023
Effective Platform Heating for Laser Powder Bed Fusion of an Al-Mn-Sc-Based AlloyDina Bayoumy, Torben Boll, Amal Shaji Karapuzha, et al.Materials (Basel, Switzerland)|November 25, 2020
Phase Transition Kinetics in Austempered Ductile Iron (ADI) with Regard to Mo ContentMartin Landesberger, Robert Koos, Michael Hofmann, et al.Materials (Basel, Switzerland)|February 25, 2023
The Piezoresponse in WO3 Thin Films Due to N2-Filled Nanovoids Enrichment by Atom Probe TomographyPamela M Pineda-Domínguez, Torben Boll, John Nogan, et al.Scientific Reports|June 14, 2017
L12 ordering and δ' precipitation in Al-Cu-LiPascal Neibecker, Michael Leitner, Muna Kushaim, et al.Scientific Reports|March 27, 2024
One-step sputtering of MoSSe metastable phase as thin film and predicted thermodynamic stability by computational methodsOscar A López-Galán, Torben Boll, John Nogan, et al.Communications Materials|November 11, 2024
The influence of lattice misfit on screw and edge dislocation-controlled solid solution strengthening in Mo-Ti alloysGeorg Winkens, Alexander Kauffmann, Johannes Herrmann, et al.Nanoscale Advances|September 22, 2022
Microscopic origin of highly enhanced current carrying capabilities of thin NdFeAs(O,F) filmsSandra Kauffmann-Weiss, Kazumasa Iida, Chiara Tarantini, et al.Pageof 2