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Toshihide Agemura

Showing results (1-10 of 5) with videos related to

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Microscopy (Oxford, England)|January 18, 2018
Collection efficiency and acceptance maps of electron detectors for understanding signal detection on modern scanning electron microscopyToshihide Agemura, Takashi Sekiguchi
Microscopy (Oxford, England)|December 12, 2022
Temporal resolution in transmission electron microscopy using a photoemission electron sourceMakoto Kuwahara, Toshihide Agemura
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 25, 2023
Development of General-purpose Dielectric Constant Imaging Unit for SEM and Direct Observation of Samples in Aqueous SolutionToshihiko Ogura, Tomoko Okada, Michio Hatano, et al.
Ultramicroscopy|September 17, 2021
Brightness evaluation of pulsed electron gun using negative electron affinity photocathode developed for time-resolved measurement using scanning electron microscopeHideo Morishita, Takashi Ohshima, Kazuo Otsuga, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 15, 2022
A Novel Monochromator with Offset Cylindrical Lenses and Its Application to a Low-Voltage Scanning Electron MicroscopeTakashi Ogawa, Yu Yamazawa, Satoshi Kawai, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Microscopy (Oxford, England)|January 18, 2018
Collection efficiency and acceptance maps of electron detectors for understanding signal detection on modern scanning electron microscopyToshihide Agemura, Takashi Sekiguchi
Microscopy (Oxford, England)|December 12, 2022
Temporal resolution in transmission electron microscopy using a photoemission electron sourceMakoto Kuwahara, Toshihide Agemura
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 25, 2023
Development of General-purpose Dielectric Constant Imaging Unit for SEM and Direct Observation of Samples in Aqueous SolutionToshihiko Ogura, Tomoko Okada, Michio Hatano, et al.
Ultramicroscopy|September 17, 2021
Brightness evaluation of pulsed electron gun using negative electron affinity photocathode developed for time-resolved measurement using scanning electron microscopeHideo Morishita, Takashi Ohshima, Kazuo Otsuga, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 15, 2022
A Novel Monochromator with Offset Cylindrical Lenses and Its Application to a Low-Voltage Scanning Electron MicroscopeTakashi Ogawa, Yu Yamazawa, Satoshi Kawai, et al.
Pageof 1