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Journal of Applied Crystallography|April 10, 2024
Simulations of dislocation contrast in dark-field X-ray microscopySina Borgi, Trygve Magnus Ræder, Mads Allerup Carlsen, et al.
Materials (Basel, Switzerland)|June 29, 2019
Controlling Phase Purity and Texture of K<sub>0.5</sub>Na<sub>0.5</sub>NbO<sub>3</sub> Thin Films by Aqueous Chemical Solution DepositionNikolai Helth Gaukås, Silje Marie Dale, Trygve Magnus Ræder, et al.
Proceedings of the National Academy of Sciences of the United States of America|September 19, 2023
Real-time imaging of acoustic waves in bulk materials with X-ray microscopyTheodor S Holstad, Leora E Dresselhaus-Marais, Trygve Magnus Ræder, et al.
Scientific Reports|October 16, 2023
Simultaneous bright- and dark-field X-ray microscopy at X-ray free electron lasersLeora E Dresselhaus-Marais, Bernard Kozioziemski, Theodor S Holstad, et al.
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